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| author |   k.kedron <k.kedron@partner.samsung.com> | 2019-06-18 09:24:41 +0200 |
|---|---|---|
| committer |   Ofir Sonsino <ofir.sonsino@intl.att.com> | 2019-06-23 10:00:22 +0000 |
| commit | a5b875badca6bc73d18d609a91cdfddfb5a0f396 (patch) | |
| tree | 2fab10de2f35b1cb2bbec4c48f06eff11dfb3344 /src/main/java/org/onap/sdc/common/onaplog/OnapMDCWrapper.java | |
| parent | bbb56de1b8f5ab2322fea0a7537bfe1b9c23a366 (diff) | |
Improved unit tests for onaplog package.
Added new tests to OnapLoggerDebug, OnapLoggerError and OnapLoggerMetric test.
Updated unit tests for the OnapLoggerAudit and OnapLoggerGeneric.
Issue-ID: SDC-2327
Signed-off-by: Krystian Kedron <k.kedron@partner.samsung.com>
Change-Id: Icc6fa07fd9b91be0b441956df9f01a9bff9b5723
Diffstat (limited to 'src/main/java/org/onap/sdc/common/onaplog/OnapMDCWrapper.java')
0 files changed, 0 insertions, 0 deletions