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| author |   k.kedron <k.kedron@partner.samsung.com> | 2019-06-05 13:48:01 +0200 |
|---|---|---|
| committer |   Ofir Sonsino <ofir.sonsino@intl.att.com> | 2019-06-17 07:16:03 +0000 |
| commit | 6024cceed6a018d6722e96d5440ca43f68e1dcd6 (patch) | |
| tree | e4ab61fd2b41cb92d06abca334aadff4d5913ac0 /INFO.yaml | |
| parent | 4b1861c863570af103e0c070e8834f97dfc35075 (diff) | |
Improve the test coverage of OnapLoggerAudit and fix log method in OnapLoogerBase.
Improve the unit test in OnapLoggerAudit and OnapLoogerBase.
Fix the log method for DEBUG LogLevel.
Issue-ID: SDC-2327
Signed-off-by: Krystian Kedron <k.kedron@partner.samsung.com>
Change-Id: Iff9773dbf108020accd9f65ea89b9cdcb1dd2c0e
Diffstat (limited to 'INFO.yaml')
0 files changed, 0 insertions, 0 deletions