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Change-Id: I95381232eeefcd247a66a5cec370a8ce1c288e18
Issue-ID: SO-670
Signed-off-by: Benjamin, Max (mb388a) <mb388a@us.att.com>
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Change-Id: I7b28cc713929400b03b7e567bf9823d82631a1e9
Issue-ID: SO-617
Signed-off-by: Lukasz Muszkieta <lukasz.muszkieta@nokia.com>
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Increase Jnits coverage for catalog db
Issue-ID: SO-532
Change-Id: I7a66a38103b2cf2bdad2d066bcc72a590809be53
Signed-off-by: pradip01 <pradipkumar.thakker@amdocs.com>
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Add UT for CatalogDbAdapterRestTest class.
Change-Id: Id59ab7de324b37c03332170e7ebf8dfbf01f0753
Issue-ID: SO-369
Signed-off-by: subhash kumar singh <subhash.kumar.singh@huawei.com>
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This reverts commit 327b17ab250b4c17cf3f91f5e4cd9bffd89f3d1e.
It is seriously impeding our ability complete the promised merge of AT&T
1802 code.
While I'm all for coding standards, if we are serious about using spaces
instead of tabs, then I think we need to (1) agree with the community when
this will happen, (2) do consistently in all files, and (3) enforce it.
Change-Id: Ib9b996f6b6c7d81ac9ac95d58b0c7d8cc39675ff
Issue-ID: SO-368
Signed-off-by: Rob Daugherty <rd472p@att.com>
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Reduce build log warnings by formatting tests
to ONAP code conventions (removing tabs etc.)
Issue-ID: SO-368
Change-Id: I48c6d359b83617aebeb79db4e30c1d72d31f7eec
Signed-off-by: Marcus G K Williams <marcus.williams@intel.com>
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Change-Id: I1dedb9ef1ca7b734e3cfc0a3a594d733dbd298d4
Issue-ID: SO-437
Signed-off-by: Munir Ahmad <munir.ahmad@bell.ca>
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Adding new test cases for Catalog DB Adapter
Change-Id: I1e809e39a9e41a26e87d1f7690ee46f42bccc076
Issue-ID: SO-171
Signed-off-by: Arthur Martella <amartell@research.att.com>
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