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authork.kedron <k.kedron@partner.samsung.com>2019-07-22 10:08:46 +0200
committerGerrit Code Review <gerrit@onap.org>2019-07-22 08:08:46 +0000
commit723de79095a88cff8e5b6a611f56f844ab3828b6 (patch)
treeabbd407e77de34cfb578c0d5b2ae5904105e132d /docs/submodules/oom
parent4f829d70f85cfa01017180e269f14c71081f4827 (diff)
Update git submodules
* Update docs/submodules/sdc.git from branch 'master' to 2ca6a9f860889c17202d4a518eefc980a1bb139a - Improved unit tests for ArtifactValidationUtils and Sonar fixes. Added new tests for ArtifactValidationUtils. Checkstyle in the ValidationConfigManager and ArtifactValidationUtils. Added private constructor to ValidationConfigManager. Added logger for ArtifactValidationUtils and simplified code. Updated the ValidationConfigManagerTest and ReportManagerTests to not influence on each other. Issue-ID: SDC-2327 Signed-off-by: Krystian Kedron <k.kedron@partner.samsung.com> Change-Id: I9c7c725792737b6cfa6bba20eeeb3b1d4ef1e471
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