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authorJoss Armstrong <joss.armstrong@ericsson.com>2019-02-06 10:34:35 +0000
committerPatrick Brady <patrick.brady@att.com>2019-02-06 21:38:44 +0000
commit8ceb16a925d8ebd0ae05f6745a68507e990d9395 (patch)
treed31196454de547f992061019d01358bcbe836e0d /appc-dispatcher/appc-dispatcher-common/appc-data-access-lib
parent163ec605f4b3029a3b945530ed995ec8be457796 (diff)
Reduce unit test duration from 40s to 4s
Mocked retry delay value to a lower value to reduce test time Issue-ID: APPC-1393 Change-Id: I98ea66b4cd0cc47d1861544bb70ec4c0e665e394 Signed-off-by: Joss Armstrong <joss.armstrong@ericsson.com>
Diffstat (limited to 'appc-dispatcher/appc-dispatcher-common/appc-data-access-lib')
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