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| author |   Joss Armstrong <joss.armstrong@ericsson.com> | 2018-12-11 16:57:24 +0000 |
|---|---|---|
| committer |   Takamune Cho <takamune.cho@att.com> | 2018-12-13 15:00:57 +0000 |
| commit | 70da33f00f68fe04e0baf51e592071096213eebd (patch) | |
| tree | e75ae8de5869f10c3b21aaf85fc2870b9b1ec4ea /appc-dg/appc-dg-shared/appc-dg-common | |
| parent | 73dcc9677a000d0ea7b900db6fc1fb0689863b0a (diff) | |
Fix for APPC-1271
Replaced slow running tests which wait for timeout
Testing time reduced from 22 seconds to 0.5 seconds
Improved tests and line coverage increased from 26% to 96%
Issue-ID: APPC-1271
Change-Id: I88713e5c819e5ce1bf695f6de3834db7c3007285
Signed-off-by: Joss Armstrong <joss.armstrong@ericsson.com>
Diffstat (limited to 'appc-dg/appc-dg-shared/appc-dg-common')
0 files changed, 0 insertions, 0 deletions